WebTime-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a surface analytical technique that focuses a pulsed beam of primary ions onto a sample surface, producing secondary ions in a sputtering process. Analyzing these secondary ions provides information about the molecular, inorganic and elemental species present on the surface. WebToF-SIMS法では,一次ビームまたは分析ビームと呼ばれるイオンのエネルギービーム(例えば,我々のToF-SIMS V装置(Ion-ToF GmbH,ドイツ)ではBi+,30 keV)を試料表面に向ける。この一次イオンビームからエネルギーおよび運動量が試料表面に移動
4.10: ESI-QTOF-MS Coupled to HPLC and its Application for Food …
Webfor this method include quadrupole, ion trap, and TOF detectors. Quadrupole and ion trap MS operating modes (i.e., full-scan, selected ion monitoring [SIM], and selected ion storage [SIS] modes) can be selected to optimize the ion mass collection range. 3.10 Mechanical Flow Controlling Device (MFCD) means a device that is used to ensure Web8 nov. 2024 · ToF-SIMS is one of the most suitable methods for analysis of lipids attached different to cell membranes and biological materials in general.9 The method uses a high energy primary ion beam (e.g Au3+, Cs+) with pulses of 1 to 40 keV. canned salmon salad easy
Chemical ionization with the Vocus CI-TOF : Get Quote, RFQ, Price …
WebThe Agilent QTOF 6540 is equipped with exchangeable ESI/APCI ion sources. The ESI source is the JetStream source. The instrument is capable of MS and MS/MS and it is using MassHunter software for data acquisition and processing. LC pumps can handle up to … Web16 feb. 2015 · Time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging using cluster primary ion beams is used for the identification of a green painting layer on the scene The Angels concert from the … Web31 jan. 2024 · Time-of-flight secondary ion mass spectrometry ( ToF-SIMS) is extremely surface sensitive and has superior chemical selectivity, making this surface analytical technique powerful and often unique in identifying … fix printer wifi problems